Company Description

Rudolph Technologies, Inc. (Rudolph), incorporated on June 13, 1996, is engaged in the design, development, manufacture and support of process control defect inspection and metrology, advanced packaging lithography, and data analysis systems and software used by microelectronics device manufacturers. The Company provides process and yield management solutions used in both wafer processing and final manufacturing through a family of standalone systems for macro-defect inspection, lithography, probe card test and analysis, and transparent and opaque thin film measurements. [Source: Reuters]

Company Website: http://www.rudolphtech.com